Effective energy densities in KrF excimer laser reformation as a sidewall smoothing technique.
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| Title: | Effective energy densities in KrF excimer laser reformation as a sidewall smoothing technique. |
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| Authors: | Eih-Zhe Liang1, Shih-Che Hung2, Ya-Ping Hsieh1, Ching-Fuh Lin3 |
| Source: | Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; Jan/Feb2008, Vol. 26 Issue 1, p110-116, 7p, 2 Diagrams, 7 Graphs |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 29978508 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Effective energy densities in KrF excimer laser reformation as a sidewall smoothing technique. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Eih-Zhe+Liang%22">Eih-Zhe Liang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Shih-Che+Hung%22">Shih-Che Hung</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Ya-Ping+Hsieh%22">Ya-Ping Hsieh</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Ching-Fuh+Lin%22">Ching-Fuh Lin</searchLink><relatesTo>3</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Vacuum+Science+%26+Technology%3A+Part+B-Microelectronics+%26+Nanometer+Structures%22">Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures</searchLink>; Jan/Feb2008, Vol. 26 Issue 1, p110-116, 7p, 2 Diagrams, 7 Graphs |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=29978508 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1116/1.2825163 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 7 StartPage: 110 Titles: – TitleFull: Effective energy densities in KrF excimer laser reformation as a sidewall smoothing technique. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Eih-Zhe Liang – PersonEntity: Name: NameFull: Shih-Che Hung – PersonEntity: Name: NameFull: Ya-Ping Hsieh – PersonEntity: Name: NameFull: Ching-Fuh Lin IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: Jan/Feb2008 Type: published Y: 2008 Identifiers: – Type: issn-print Value: 10711023 Numbering: – Type: volume Value: 26 – Type: issue Value: 1 Titles: – TitleFull: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures Type: main |
| ResultId | 1 |