Dröge, S., Khalifah, M. S. A., O’Neill, M., Thomas, H. E., Simmonds, H. S., Macdonald, J. E., . . . Kelly, S. M. (2009). Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor. Journal of Physical Chemistry B, 113(1), 49. https://doi.org/10.1021/jp803379a
Chicago Style (17th ed.) CitationDröge, Stefan, et al. "Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor." Journal of Physical Chemistry B 113, no. 1 (2009): 49. https://doi.org/10.1021/jp803379a.
MLA (9th ed.) CitationDröge, Stefan, et al. "Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor." Journal of Physical Chemistry B, vol. 113, no. 1, 2009, p. 49, https://doi.org/10.1021/jp803379a.
Warning: These citations may not always be 100% accurate.