Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor. - Stefan Dröge; Manea S. Al Khalifah; Mary O’Neill; Huw E. Thomas; Henje S. Simmonds; J. Emyr Macdonald; Matthew P. Aldred; Panos Vlachos; Stuart P. Kitney; Andreas Löbbert; Stephen M. Kelly (Journal of Physical Chemistry B, 2009)