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Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor.

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Bibliographic Details
Title: Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor.
Authors: Stefan Dröge1, Manea S. Al Khalifah1, Mary O’Neill1, Huw E. Thomas1, Henje S. Simmonds1, J. Emyr Macdonald1, Matthew P. Aldred1, Panos Vlachos1, Stuart P. Kitney1, Andreas Löbbert1, Stephen M. Kelly1
Source: Journal of Physical Chemistry B; Jan2009, Vol. 113 Issue 1, p49-53, 5p
Database: Applied Science & Technology Source
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