APA (7th ed.) Citation

Denlinger, J., Rotenberg, E., Warwick, T., Visser, G., Nordgren, J., Guo, J., . . . Tonner, B. (1995). First results from the SpectroMicroscopy Beamline at the Advanced Light Source. Review of Scientific Instruments, 66(2), 1342. https://doi.org/10.1063/1.1145969

Chicago Style (17th ed.) Citation

Denlinger, J.D, et al. "First Results from the SpectroMicroscopy Beamline at the Advanced Light Source." Review of Scientific Instruments 66, no. 2 (1995): 1342. https://doi.org/10.1063/1.1145969.

MLA (9th ed.) Citation

Denlinger, J.D, et al. "First Results from the SpectroMicroscopy Beamline at the Advanced Light Source." Review of Scientific Instruments, vol. 66, no. 2, 1995, p. 1342, https://doi.org/10.1063/1.1145969.