Miller, C. J., & Yoder, T. S. (2010). Explosive Contamination from Substrate Surfaces: Differences and Similarities in Contamination Techniques Using RDX and C-4. Sensing & Imaging, 11(2), 77. https://doi.org/10.1007/s11220-010-0053-y
Chicago Style (17th ed.) CitationMiller, C. J., and T. S. Yoder. "Explosive Contamination from Substrate Surfaces: Differences and Similarities in Contamination Techniques Using RDX and C-4." Sensing & Imaging 11, no. 2 (2010): 77. https://doi.org/10.1007/s11220-010-0053-y.
MLA (9th ed.) CitationMiller, C. J., and T. S. Yoder. "Explosive Contamination from Substrate Surfaces: Differences and Similarities in Contamination Techniques Using RDX and C-4." Sensing & Imaging, vol. 11, no. 2, 2010, p. 77, https://doi.org/10.1007/s11220-010-0053-y.