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Effect of ohmic contact conductance on the distribution of surface and bulk currents in semiconductor planar devices.

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Bibliographic Details
Title: Effect of ohmic contact conductance on the distribution of surface and bulk currents in semiconductor planar devices.
Authors: Chong-ru Huo, Ben-yuan Gu, Coluzza, C.
Source: Journal of Applied Physics; August 15 1992, Vol. 72, p1473-1477, 5p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500025702
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Effect of ohmic contact conductance on the distribution of surface and bulk currents in semiconductor planar devices.
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  Data: <searchLink fieldCode="AU" term="%22Chong-ru+Huo%22">Chong-ru Huo</searchLink><br /><searchLink fieldCode="AU" term="%22Ben-yuan+Gu%22">Ben-yuan Gu</searchLink><br /><searchLink fieldCode="AU" term="%22Coluzza%2C+C%2E%22">Coluzza, C.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; August 15 1992, Vol. 72, p1473-1477, 5p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500025702
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/1.351711
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      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 1473
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      – TitleFull: Effect of ohmic contact conductance on the distribution of surface and bulk currents in semiconductor planar devices.
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          Name:
            NameFull: Chong-ru Huo
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            NameFull: Ben-yuan Gu
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            NameFull: Coluzza, C.
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            – D: 15
              M: 08
              Text: August 15 1992
              Type: published
              Y: 1992
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              Value: 72
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            – TitleFull: Journal of Applied Physics
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