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A threshold electron analyser for use in coincidence experiments.

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Bibliographic Details
Title: A threshold electron analyser for use in coincidence experiments.
Authors: Hatherly, P. A., Stankiewicz, M., Codling, K.
Source: Measurement Science & Technology; September 1992, Vol. 3, p891-896, 6p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500029283
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: A threshold electron analyser for use in coincidence experiments.
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      – Type: doi
        Value: 10.1088/0957-0233/3/9/015
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 891
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      – TitleFull: A threshold electron analyser for use in coincidence experiments.
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            NameFull: Hatherly, P. A.
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            NameFull: Stankiewicz, M.
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            NameFull: Codling, K.
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            – D: 01
              M: 09
              Text: September 1992
              Type: published
              Y: 1992
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