A fatigue crack growth model for single overload tests.
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| Title: | A fatigue crack growth model for single overload tests. |
|---|---|
| Authors: | Goel, H. S., Chand, Satish |
| Source: | Journal of Engineering Materials & Technology; April 1994, Vol. 116, p168-172, 5p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500126475 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500126475 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1115/1.2904268 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 5 StartPage: 168 Titles: – TitleFull: A fatigue crack growth model for single overload tests. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Goel, H. S. – PersonEntity: Name: NameFull: Chand, Satish IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: April 1994 Type: published Y: 1994 Identifiers: – Type: issn-print Value: 00944289 Numbering: – Type: volume Value: 116 Titles: – TitleFull: Journal of Engineering Materials & Technology Type: main |
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