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Mechanisms for laser-induced functional damage to silicon charge-coupled imaging sensors.

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Bibliographic Details
Title: Mechanisms for laser-induced functional damage to silicon charge-coupled imaging sensors.
Authors: Zhang, Chenzhi, Blarre, Ludovic, Walser, Rodger M.
Source: Applied Optics; September 20 1993, Vol. 32, p5201-5210, 10p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500168772
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Mechanisms for laser-induced functional damage to silicon charge-coupled imaging sensors.
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  Data: <searchLink fieldCode="AU" term="%22Zhang%2C+Chenzhi%22">Zhang, Chenzhi</searchLink><br /><searchLink fieldCode="AU" term="%22Blarre%2C+Ludovic%22">Blarre, Ludovic</searchLink><br /><searchLink fieldCode="AU" term="%22Walser%2C+Rodger+M%2E%22">Walser, Rodger M.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Optics%22">Applied Optics</searchLink>; September 20 1993, Vol. 32, p5201-5210, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500168772
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1364/AO.32.005201
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      – Code: eng
        Text: English
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        PageCount: 10
        StartPage: 5201
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      – TitleFull: Mechanisms for laser-induced functional damage to silicon charge-coupled imaging sensors.
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          Name:
            NameFull: Zhang, Chenzhi
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            NameFull: Blarre, Ludovic
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            NameFull: Walser, Rodger M.
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            – D: 20
              M: 09
              Text: September 20 1993
              Type: published
              Y: 1993
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              Value: 32
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            – TitleFull: Applied Optics
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