Optical characterization in microelectronics manufacturing.
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| Title: | Optical characterization in microelectronics manufacturing. |
|---|---|
| Authors: | Perkowitz, S., Seiler, D. G., Duncan, W. M. |
| Source: | Journal of Research of the National Institute of Standards & Technology; September/October 1994, Vol. 99, p605-639, 35p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500181795 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500181795 |
| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 35 StartPage: 605 Titles: – TitleFull: Optical characterization in microelectronics manufacturing. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Perkowitz, S. – PersonEntity: Name: NameFull: Seiler, D. G. – PersonEntity: Name: NameFull: Duncan, W. M. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 09 Text: September/October 1994 Type: published Y: 1994 Identifiers: – Type: issn-print Value: 1044677X Numbering: – Type: volume Value: 99 Titles: – TitleFull: Journal of Research of the National Institute of Standards & Technology Type: main |
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