Optical characterization in microelectronics manufacturing.

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Bibliographic Details
Title: Optical characterization in microelectronics manufacturing.
Authors: Perkowitz, S., Seiler, D. G., Duncan, W. M.
Source: Journal of Research of the National Institute of Standards & Technology; September/October 1994, Vol. 99, p605-639, 35p
Database: Applied Science & Technology Source
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PubType: Academic Journal
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      – Code: eng
        Text: English
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        PageCount: 35
        StartPage: 605
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      – TitleFull: Optical characterization in microelectronics manufacturing.
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            NameFull: Perkowitz, S.
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            NameFull: Seiler, D. G.
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              Text: September/October 1994
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              Y: 1994
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