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Measurement of submicrometer Al2O3 particles in plumes.

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Bibliographic Details
Title: Measurement of submicrometer Al2O3 particles in plumes.
Authors: Kim, H.-O., Laredo, D., Netzer, D. W.
Source: Applied Optics; November 20 1993, Vol. 32, p6834-6840, 7p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500191299
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Measurement of submicrometer Al2O3 particles in plumes.
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  Data: <searchLink fieldCode="JN" term="%22Applied+Optics%22">Applied Optics</searchLink>; November 20 1993, Vol. 32, p6834-6840, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500191299
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1364/AO.32.006834
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 6834
    Titles:
      – TitleFull: Measurement of submicrometer Al2O3 particles in plumes.
        Type: main
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          Name:
            NameFull: Kim, H.-O.
      – PersonEntity:
          Name:
            NameFull: Laredo, D.
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            NameFull: Netzer, D. W.
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            – D: 20
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              Text: November 20 1993
              Type: published
              Y: 1993
          Identifiers:
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              Value: 00036935
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              Value: 32
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            – TitleFull: Applied Optics
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