APA (7th ed.) Citation

Chaudhuri, J., & Hashmi, F. (1994). Determination of thickness of multiple layer thin films by an x-ray-diffraction technique. Journal of Applied Physics, 76, 4454. https://doi.org/10.1063/1.357275

Chicago Style (17th ed.) Citation

Chaudhuri, J., and F. Hashmi. "Determination of Thickness of Multiple Layer Thin Films by an X-ray-diffraction Technique." Journal of Applied Physics 76 (1994): 4454. https://doi.org/10.1063/1.357275.

MLA (9th ed.) Citation

Chaudhuri, J., and F. Hashmi. "Determination of Thickness of Multiple Layer Thin Films by an X-ray-diffraction Technique." Journal of Applied Physics, vol. 76, 1994, p. 4454, https://doi.org/10.1063/1.357275.