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Determination of thickness of multiple layer thin films by an x-ray-diffraction technique.

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Bibliographic Details
Title: Determination of thickness of multiple layer thin films by an x-ray-diffraction technique.
Authors: Chaudhuri, J., Hashmi, F.
Source: Journal of Applied Physics; October 1 1994, Vol. 76, p4454-4456, 3p
Database: Applied Science & Technology Source
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