APA (7th ed.) Citation

Fu, J., Croarkin, M. C., & Vorburger, T. V. (1994). The measurement and uncertainty of a calibration standard for the scanning electron microscope. Journal of Research of the National Institute of Standards & Technology, 99, 191.

Chicago Style (17th ed.) Citation

Fu, J., M. C. Croarkin, and T. V. Vorburger. "The Measurement and Uncertainty of a Calibration Standard for the Scanning Electron Microscope." Journal of Research of the National Institute of Standards & Technology 99 (1994): 191.

MLA (9th ed.) Citation

Fu, J., et al. "The Measurement and Uncertainty of a Calibration Standard for the Scanning Electron Microscope." Journal of Research of the National Institute of Standards & Technology, vol. 99, 1994, p. 191.