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The measurement and uncertainty of a calibration standard for the scanning electron microscope.

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Title: The measurement and uncertainty of a calibration standard for the scanning electron microscope.
Authors: Fu, J., Croarkin, M. C., Vorburger, T. V.
Source: Journal of Research of the National Institute of Standards & Technology; March/April 1994, Vol. 99, p191-199, 9p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500229996
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500229996
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      – Code: eng
        Text: English
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        PageCount: 9
        StartPage: 191
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      – TitleFull: The measurement and uncertainty of a calibration standard for the scanning electron microscope.
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            NameFull: Fu, J.
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            NameFull: Croarkin, M. C.
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            NameFull: Vorburger, T. V.
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              Text: March/April 1994
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              Y: 1994
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