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Surface modifications in strained-layer heteroepitaxy studied by UHV-scanning tunneling microscopy.

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Bibliographic Details
Title: Surface modifications in strained-layer heteroepitaxy studied by UHV-scanning tunneling microscopy.
Authors: Springholz, G., Frank, N., Bauer, G.
Source: Solid-State Electronics; 1996, Vol. 40 Issue 1-8, p571-577, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500263272
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Surface modifications in strained-layer heteroepitaxy studied by UHV-scanning tunneling microscopy.
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1016/0038-1101(95)00292-8
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 571
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      – TitleFull: Surface modifications in strained-layer heteroepitaxy studied by UHV-scanning tunneling microscopy.
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            NameFull: Springholz, G.
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            NameFull: Frank, N.
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              Text: 1996
              Type: published
              Y: 1996
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              Value: 40
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            – TitleFull: Solid-State Electronics
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