APA (7th ed.) Citation

Çelik-Butler, Z., Zhang, R., & Patel, N. (1996). 1/f noise and electromigration in multilayered via structures. Solid-State Electronics, 39, 281. https://doi.org/10.1016/0038-1101(95)00127-1

Chicago Style (17th ed.) Citation

Çelik-Butler, Z., R. Zhang, and N. Patel. "1/f Noise and Electromigration in Multilayered via Structures." Solid-State Electronics 39 (1996): 281. https://doi.org/10.1016/0038-1101(95)00127-1.

MLA (9th ed.) Citation

Çelik-Butler, Z., et al. "1/f Noise and Electromigration in Multilayered via Structures." Solid-State Electronics, vol. 39, 1996, p. 281, https://doi.org/10.1016/0038-1101(95)00127-1.