APA (7th ed.) Citation

Chavan, A. V., Stringfellow, D. W., & Mallarapu, S. R. (1996). “Pseudo full scan” tests mixed-signal ICs. Electronic Design, 44, 50.

Chicago Style (17th ed.) Citation

Chavan, A. V., D. W. Stringfellow, and S. R. Mallarapu. "“Pseudo Full Scan” Tests Mixed-signal ICs." Electronic Design 44 (1996): 50.

MLA (9th ed.) Citation

Chavan, A. V., et al. "“Pseudo Full Scan” Tests Mixed-signal ICs." Electronic Design, vol. 44, 1996, p. 50.