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“Pseudo full scan” tests mixed-signal ICs.

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Bibliographic Details
Title:	“Pseudo full scan” tests mixed-signal ICs.
Authors:	Chavan, A. V., Stringfellow, D. W., Mallarapu, S. R.
Source:	Electronic Design; 11/18/96, Vol. 44, p50
Database:	Applied Science & Technology Source

Description
ISSN:	00134872