“Pseudo full scan” tests mixed-signal ICs.
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| Title: | “Pseudo full scan” tests mixed-signal ICs. |
|---|---|
| Authors: | Chavan, A. V., Stringfellow, D. W., Mallarapu, S. R. |
| Source: | Electronic Design; 11/18/96, Vol. 44, p50 |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500316052 AccessLevel: 2 PubType: Periodical PubTypeId: serialPeriodical PreciseRelevancyScore: 0 |
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| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: StartPage: 50 Titles: – TitleFull: “Pseudo full scan” tests mixed-signal ICs. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chavan, A. V. – PersonEntity: Name: NameFull: Stringfellow, D. W. – PersonEntity: Name: NameFull: Mallarapu, S. R. IsPartOfRelationships: – BibEntity: Dates: – D: 18 M: 11 Text: 11/18/96 Type: published Y: 1996 Identifiers: – Type: issn-print Value: 00134872 Numbering: – Type: volume Value: 44 Titles: – TitleFull: Electronic Design Type: main |
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