Some critical remarks on a hierarchy of fault-detecting abilities of test methods.

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Title: Some critical remarks on a hierarchy of fault-detecting abilities of test methods.
Authors: DeMillo, Richard A., Mathur, Aditya P., Wong, W. Eric
Source: IEEE Transactions on Software Engineering; October 1995, Vol. 21, p858-863, 6p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 500336407
AccessLevel: 2
PubType: Academic Journal
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  Data: Some critical remarks on a hierarchy of fault-detecting abilities of test methods.
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        Value: 10.1109/32.469455
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        Text: English
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        PageCount: 6
        StartPage: 858
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      – TitleFull: Some critical remarks on a hierarchy of fault-detecting abilities of test methods.
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            NameFull: DeMillo, Richard A.
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            NameFull: Mathur, Aditya P.
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            NameFull: Wong, W. Eric
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              Text: October 1995
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              Y: 1995
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              Value: 21
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