Some critical remarks on a hierarchy of fault-detecting abilities of test methods.
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| Title: | Some critical remarks on a hierarchy of fault-detecting abilities of test methods. |
|---|---|
| Authors: | DeMillo, Richard A., Mathur, Aditya P., Wong, W. Eric |
| Source: | IEEE Transactions on Software Engineering; October 1995, Vol. 21, p858-863, 6p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500336407 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500336407 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/32.469455 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 858 Titles: – TitleFull: Some critical remarks on a hierarchy of fault-detecting abilities of test methods. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: DeMillo, Richard A. – PersonEntity: Name: NameFull: Mathur, Aditya P. – PersonEntity: Name: NameFull: Wong, W. Eric IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 10 Text: October 1995 Type: published Y: 1995 Identifiers: – Type: issn-print Value: 00985589 Numbering: – Type: volume Value: 21 Titles: – TitleFull: IEEE Transactions on Software Engineering Type: main |
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