A relationship between interface trap density and transconductance in 6H-SiC enhancement mode field-effect transistors.
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| Title: | A relationship between interface trap density and transconductance in 6H-SiC enhancement mode field-effect transistors. |
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| Authors: | Dryfuse, M. W., Tabib-Azar, M. |
| Source: | Solid-State Electronics; September 1996, Vol. 39, p1331-1335, 5p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00381101 |
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| DOI: | 10.1016/0038-1101(96)00035-4 |
