APA (7th ed.) Citation

Funsten, H. O., Suszcynsky, D. M., & Harper, R. W. (1996). Mean secondary electron yield of avalanche electrons in the channels of a microchannels plate detector. Review of Scientific Instruments, 67, 3478. https://doi.org/10.1063/1.1147162

Chicago Style (17th ed.) Citation

Funsten, H. O., D. M. Suszcynsky, and R. W. Harper. "Mean Secondary Electron Yield of Avalanche Electrons in the Channels of a Microchannels Plate Detector." Review of Scientific Instruments 67 (1996): 3478. https://doi.org/10.1063/1.1147162.

MLA (9th ed.) Citation

Funsten, H. O., et al. "Mean Secondary Electron Yield of Avalanche Electrons in the Channels of a Microchannels Plate Detector." Review of Scientific Instruments, vol. 67, 1996, p. 3478, https://doi.org/10.1063/1.1147162.