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Interdiffusion in GaAs(1-x)Sbx/GaAs superlattices studied with high-resolution x-ray diffraction and secondary ion mass spectroscopy.

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Bibliographic Details
Title: Interdiffusion in GaAs(1-x)Sbx/GaAs superlattices studied with high-resolution x-ray diffraction and secondary ion mass spectroscopy.
Authors: Senz, S., Egger, U., Schultz, M.
Source: Journal of Applied Physics; September 1 1998, Vol. 84 Issue 5, p2546-2550, 5p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500419331
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Interdiffusion in GaAs(1-x)Sbx/GaAs superlattices studied with high-resolution x-ray diffraction and secondary ion mass spectroscopy.
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  Data: <searchLink fieldCode="AU" term="%22Senz%2C+S%2E%22">Senz, S.</searchLink><br /><searchLink fieldCode="AU" term="%22Egger%2C+U%2E%22">Egger, U.</searchLink><br /><searchLink fieldCode="AU" term="%22Schultz%2C+M%2E%22">Schultz, M.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; September 1 1998, Vol. 84 Issue 5, p2546-2550, 5p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500419331
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/1.368416
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 5
        StartPage: 2546
    Titles:
      – TitleFull: Interdiffusion in GaAs(1-x)Sbx/GaAs superlattices studied with high-resolution x-ray diffraction and secondary ion mass spectroscopy.
        Type: main
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          Name:
            NameFull: Senz, S.
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            NameFull: Egger, U.
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            NameFull: Schultz, M.
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            – D: 01
              M: 09
              Text: September 1 1998
              Type: published
              Y: 1998
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              Value: 84
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              Value: 5
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            – TitleFull: Journal of Applied Physics
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