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Statistical modeling of charge collection in semiconductor gamma-ray spectrometers.

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Bibliographic Details
Title: Statistical modeling of charge collection in semiconductor gamma-ray spectrometers.
Authors: Nemirovsky, Y.
Source: Journal of Applied Physics; January 1 1999, Vol. 85 Issue 1, p8-15, 8p
Database: Applied Science & Technology Source
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        Value: 10.1063/1.369425
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        Text: English
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              Text: January 1 1999
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              Y: 1999
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