APA (7th ed.) Citation

Lai, T., & Lin, W. (1997). Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis. Applied Optics, 36, 4419. https://doi.org/10.1364/AO.36.004419

Chicago Style (17th ed.) Citation

Lai, Tianshu, and Weizhu Lin. "Recordable Depth of View and Allowable Farthest Far-field Distance of In-line Far-field Holography for Micro-object Analysis." Applied Optics 36 (1997): 4419. https://doi.org/10.1364/AO.36.004419.

MLA (9th ed.) Citation

Lai, Tianshu, and Weizhu Lin. "Recordable Depth of View and Allowable Farthest Far-field Distance of In-line Far-field Holography for Micro-object Analysis." Applied Optics, vol. 36, 1997, p. 4419, https://doi.org/10.1364/AO.36.004419.