Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis.
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| Title: | Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis. |
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| Authors: | Lai, Tianshu, Lin, Weizhu |
| Source: | Applied Optics; July 1 1997, Vol. 36, p4419-4424, 6p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500475378 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Lai%2C+Tianshu%22">Lai, Tianshu</searchLink><br /><searchLink fieldCode="AU" term="%22Lin%2C+Weizhu%22">Lin, Weizhu</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Applied+Optics%22">Applied Optics</searchLink>; July 1 1997, Vol. 36, p4419-4424, 6p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500475378 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1364/AO.36.004419 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 4419 Titles: – TitleFull: Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Lai, Tianshu – PersonEntity: Name: NameFull: Lin, Weizhu IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: July 1 1997 Type: published Y: 1997 Identifiers: – Type: issn-print Value: 00036935 Numbering: – Type: volume Value: 36 Titles: – TitleFull: Applied Optics Type: main |
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