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Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis.

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Bibliographic Details
Title: Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis.
Authors: Lai, Tianshu, Lin, Weizhu
Source: Applied Optics; July 1 1997, Vol. 36, p4419-4424, 6p
Database: Applied Science & Technology Source
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