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Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7-x films.

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Bibliographic Details
Title: Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7-x films.
Authors: Takeuchi, I., Wei, T., Duewer, Fred
Source: Applied Physics Letters; October 6 1997, Vol. 71, p2026-2028, 3p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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  Data: Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7-x films.
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1063/1.119776
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 3
        StartPage: 2026
    Titles:
      – TitleFull: Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7-x films.
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          Name:
            NameFull: Takeuchi, I.
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          Name:
            NameFull: Wei, T.
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            NameFull: Duewer, Fred
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            – D: 06
              M: 10
              Text: October 6 1997
              Type: published
              Y: 1997
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              Value: 71
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            – TitleFull: Applied Physics Letters
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