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A revised model for carrier trapping-detrapping 1/f noise.

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Title: A revised model for carrier trapping-detrapping 1/f noise.
Authors: Nemirovsky, Amikam, Ron, Amiram
Source: Solid-State Electronics; November 1997, Vol. 41, p1811-1818, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500519407
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: A revised model for carrier trapping-detrapping 1/f noise.
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  Data: <searchLink fieldCode="JN" term="%22Solid-State+Electronics%22">Solid-State Electronics</searchLink>; November 1997, Vol. 41, p1811-1818, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500519407
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1016/S0038-1101(97)00156-1
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 8
        StartPage: 1811
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      – TitleFull: A revised model for carrier trapping-detrapping 1/f noise.
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          Name:
            NameFull: Nemirovsky, Amikam
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            NameFull: Ron, Amiram
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          Dates:
            – D: 01
              M: 11
              Text: November 1997
              Type: published
              Y: 1997
          Identifiers:
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              Value: 00381101
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            – Type: volume
              Value: 41
          Titles:
            – TitleFull: Solid-State Electronics
              Type: main
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