ECL storage elements: modeling of faulty behavior.

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Bibliographic Details
Title: ECL storage elements: modeling of faulty behavior.
Authors: Menon, Sankaran M., Malaiya, Yashwant K., Jayasumana, Anura P.
Source: IEEE Transactions on Circuits & Systems. Part II: Express Briefs; November 1997, Vol. 44, p970-974, 5p
Database: Applied Science & Technology Source
Description
ISSN:15497747