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ECL storage elements: modeling of faulty behavior.

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Title: ECL storage elements: modeling of faulty behavior.
Authors: Menon, Sankaran M., Malaiya, Yashwant K., Jayasumana, Anura P.
Source: IEEE Transactions on Circuits & Systems. Part II: Express Briefs; November 1997, Vol. 44, p970-974, 5p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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      – Code: eng
        Text: English
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        PageCount: 5
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      – TitleFull: ECL storage elements: modeling of faulty behavior.
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            NameFull: Malaiya, Yashwant K.
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              Text: November 1997
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              Y: 1997
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