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In-plane anomalies of the exchange bias field in Ni80Fe20/Fe50Mn50 bilayers on Cu(110)

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Bibliographic Details
Title: In-plane anomalies of the exchange bias field in Ni80Fe20/Fe50Mn50 bilayers on Cu(110)
Authors: Riedling, S., Bauer, M., Mathieu, C.
Source: Journal of Applied Physics; May 1 1999, Vol. 85 Issue 9, p6648-6651, 4p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500525165
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: In-plane anomalies of the exchange bias field in Ni80Fe20/Fe50Mn50 bilayers on Cu(110)
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  Data: <searchLink fieldCode="AU" term="%22Riedling%2C+S%2E%22">Riedling, S.</searchLink><br /><searchLink fieldCode="AU" term="%22Bauer%2C+M%2E%22">Bauer, M.</searchLink><br /><searchLink fieldCode="AU" term="%22Mathieu%2C+C%2E%22">Mathieu, C.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; May 1 1999, Vol. 85 Issue 9, p6648-6651, 4p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500525165
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1063/1.370174
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 4
        StartPage: 6648
    Titles:
      – TitleFull: In-plane anomalies of the exchange bias field in Ni80Fe20/Fe50Mn50 bilayers on Cu(110)
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Riedling, S.
      – PersonEntity:
          Name:
            NameFull: Bauer, M.
      – PersonEntity:
          Name:
            NameFull: Mathieu, C.
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          Dates:
            – D: 01
              M: 05
              Text: May 1 1999
              Type: published
              Y: 1999
          Identifiers:
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              Value: 00218979
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              Value: 85
            – Type: issue
              Value: 9
          Titles:
            – TitleFull: Journal of Applied Physics
              Type: main
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