Dielectric spectroscopy—an analytical tool for monitoring the deterioration due to high energy radiation in ethylene propylene diene terpolymer (EPDM) vulcanizates.

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Title: Dielectric spectroscopy—an analytical tool for monitoring the deterioration due to high energy radiation in ethylene propylene diene terpolymer (EPDM) vulcanizates.
Authors: Shah, C. S., Patni, M. J., Pandya, M. V.
Source: Journal of Materials Science; Nov1997, Vol. 32, p6119-6126, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500529869
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Dielectric spectroscopy—an analytical tool for monitoring the deterioration due to high energy radiation in ethylene propylene diene terpolymer (EPDM) vulcanizates.
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  Data: <searchLink fieldCode="AU" term="%22Shah%2C+C%2E+S%2E%22">Shah, C. S.</searchLink><br /><searchLink fieldCode="AU" term="%22Patni%2C+M%2E+J%2E%22">Patni, M. J.</searchLink><br /><searchLink fieldCode="AU" term="%22Pandya%2C+M%2E+V%2E%22">Pandya, M. V.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%22">Journal of Materials Science</searchLink>; Nov1997, Vol. 32, p6119-6126, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500529869
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 6119
    Titles:
      – TitleFull: Dielectric spectroscopy—an analytical tool for monitoring the deterioration due to high energy radiation in ethylene propylene diene terpolymer (EPDM) vulcanizates.
        Type: main
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            NameFull: Shah, C. S.
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            NameFull: Patni, M. J.
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            NameFull: Pandya, M. V.
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              Text: Nov1997
              Type: published
              Y: 1997
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              Value: 32
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