APA (7th ed.) Citation

Tabib-Azar, M., Pathak, P. S., & Ponchak, G. (1999). Nondestructive superresolution imaging of defects and nonuniformities in metals, semiconductors, dielectrics, composites, and plants using evanescent microwaves. Review of Scientific Instruments, 70(6), 2783. https://doi.org/10.1063/1.1149795

Chicago Style (17th ed.) Citation

Tabib-Azar, M., P. S. Pathak, and G. Ponchak. "Nondestructive Superresolution Imaging of Defects and Nonuniformities in Metals, Semiconductors, Dielectrics, Composites, and Plants Using Evanescent Microwaves." Review of Scientific Instruments 70, no. 6 (1999): 2783. https://doi.org/10.1063/1.1149795.

MLA (9th ed.) Citation

Tabib-Azar, M., et al. "Nondestructive Superresolution Imaging of Defects and Nonuniformities in Metals, Semiconductors, Dielectrics, Composites, and Plants Using Evanescent Microwaves." Review of Scientific Instruments, vol. 70, no. 6, 1999, p. 2783, https://doi.org/10.1063/1.1149795.