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Nondestructive superresolution imaging of defects and nonuniformities in metals, semiconductors, dielectrics, composites, and plants using evanescent microwaves.

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Title: Nondestructive superresolution imaging of defects and nonuniformities in metals, semiconductors, dielectrics, composites, and plants using evanescent microwaves.
Authors: Tabib-Azar, M., Pathak, P. S., Ponchak, G.
Source: Review of Scientific Instruments; June 1999, Vol. 70 Issue 6, p2783-2792, 10p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500536026
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PubType: Academic Journal
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  Data: Nondestructive superresolution imaging of defects and nonuniformities in metals, semiconductors, dielectrics, composites, and plants using evanescent microwaves.
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  Data: <searchLink fieldCode="JN" term="%22Review+of+Scientific+Instruments%22">Review of Scientific Instruments</searchLink>; June 1999, Vol. 70 Issue 6, p2783-2792, 10p
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        Value: 10.1063/1.1149795
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      – Code: eng
        Text: English
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        PageCount: 10
        StartPage: 2783
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      – TitleFull: Nondestructive superresolution imaging of defects and nonuniformities in metals, semiconductors, dielectrics, composites, and plants using evanescent microwaves.
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            NameFull: Pathak, P. S.
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            NameFull: Ponchak, G.
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            – D: 01
              M: 06
              Text: June 1999
              Type: published
              Y: 1999
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              Value: 70
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              Value: 6
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            – TitleFull: Review of Scientific Instruments
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