Nondestructive superresolution imaging of defects and nonuniformities in metals, semiconductors, dielectrics, composites, and plants using evanescent microwaves.
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| Title: | Nondestructive superresolution imaging of defects and nonuniformities in metals, semiconductors, dielectrics, composites, and plants using evanescent microwaves. |
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| Authors: | Tabib-Azar, M., Pathak, P. S., Ponchak, G. |
| Source: | Review of Scientific Instruments; June 1999, Vol. 70 Issue 6, p2783-2792, 10p |
| Database: | Applied Science & Technology Source |
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