Böhmisch, M., Burmeister, F., & Rettenberger, A. (1997). Atomic force microscope based Kelvin probe measurements: Application to an electrochemical reaction. Journal of Physical Chemistry B., 101, 10162. https://doi.org/10.1021/jp9728767
Chicago Style (17th ed.) CitationBöhmisch, M., F. Burmeister, and A. Rettenberger. "Atomic Force Microscope Based Kelvin Probe Measurements: Application to an Electrochemical Reaction." Journal of Physical Chemistry B. 101 (1997): 10162. https://doi.org/10.1021/jp9728767.
MLA (9th ed.) CitationBöhmisch, M., et al. "Atomic Force Microscope Based Kelvin Probe Measurements: Application to an Electrochemical Reaction." Journal of Physical Chemistry B., vol. 101, 1997, p. 10162, https://doi.org/10.1021/jp9728767.