Atomic force microscope based Kelvin probe measurements: application to an electrochemical reaction.
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| Title: | Atomic force microscope based Kelvin probe measurements: application to an electrochemical reaction. |
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| Authors: | Böhmisch, M., Burmeister, F., Rettenberger, A. |
| Source: | Journal of Physical Chemistry B.; December 4 1997, Vol. 101, p10162-10165, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 10895647 |
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| DOI: | 10.1021/jp9728767 |
