APA (7th ed.) Citation

Bocchi, C., Franchi, S., & Germini, F. (1999). Measurement of aluminum concentration in the Ga1-xAlxSb/GaSb epitaxial system. Journal of Applied Physics, 86(3), 1298. https://doi.org/10.1063/1.370885

Chicago Style (17th ed.) Citation

Bocchi, C., S. Franchi, and F. Germini. "Measurement of Aluminum Concentration in the Ga1-xAlxSb/GaSb Epitaxial System." Journal of Applied Physics 86, no. 3 (1999): 1298. https://doi.org/10.1063/1.370885.

MLA (9th ed.) Citation

Bocchi, C., et al. "Measurement of Aluminum Concentration in the Ga1-xAlxSb/GaSb Epitaxial System." Journal of Applied Physics, vol. 86, no. 3, 1999, p. 1298, https://doi.org/10.1063/1.370885.