APA (7th ed.) Citation

Simpson, R., Danko, J., & Watts, M. (1999). Laser improvements benefit darkfield wafer inspection. Laser Focus World, 35(10), 144.

Chicago Style (17th ed.) Citation

Simpson, Rob, Joe Danko, and Michael Watts. "Laser Improvements Benefit Darkfield Wafer Inspection." Laser Focus World 35, no. 10 (1999): 144.

MLA (9th ed.) Citation

Simpson, Rob, et al. "Laser Improvements Benefit Darkfield Wafer Inspection." Laser Focus World, vol. 35, no. 10, 1999, p. 144.