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Scanning near-field optical microscopy in the near-infrared region using light emitting cantilever probes.

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Bibliographic Details
Title: Scanning near-field optical microscopy in the near-infrared region using light emitting cantilever probes.
Authors: Heisig, S., Rudow, O., Oesterschulze, E.
Source: Applied Physics Letters; August 21 2000, Vol. 77 Issue 8, p1071-1073, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500615316
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PubType: Academic Journal
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  Data: Scanning near-field optical microscopy in the near-infrared region using light emitting cantilever probes.
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  Data: <searchLink fieldCode="AU" term="%22Heisig%2C+S%2E%22">Heisig, S.</searchLink><br /><searchLink fieldCode="AU" term="%22Rudow%2C+O%2E%22">Rudow, O.</searchLink><br /><searchLink fieldCode="AU" term="%22Oesterschulze%2C+E%2E%22">Oesterschulze, E.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; August 21 2000, Vol. 77 Issue 8, p1071-1073, 3p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500615316
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1063/1.1289261
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      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 1071
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      – TitleFull: Scanning near-field optical microscopy in the near-infrared region using light emitting cantilever probes.
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            NameFull: Heisig, S.
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            NameFull: Rudow, O.
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            NameFull: Oesterschulze, E.
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            – D: 21
              M: 08
              Text: August 21 2000
              Type: published
              Y: 2000
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