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Minimisation of power dissipation during test application in full-scan sequential circuits using primary input freezing.

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Title: Minimisation of power dissipation during test application in full-scan sequential circuits using primary input freezing.
Authors: Nicolici, N., Al-Hashimi, B. M., Williams, A. C.
Source: IEE Proceedings -- Computers & Digital Techniques; September 2000, Vol. 147 Issue 5, p313-322, 10p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500621876
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Minimisation of power dissipation during test application in full-scan sequential circuits using primary input freezing.
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  Data: <searchLink fieldCode="AU" term="%22Nicolici%2C+N%2E%22">Nicolici, N.</searchLink><br /><searchLink fieldCode="AU" term="%22Al-Hashimi%2C+B%2E+M%2E%22">Al-Hashimi, B. M.</searchLink><br /><searchLink fieldCode="AU" term="%22Williams%2C+A%2E+C%2E%22">Williams, A. C.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEE+Proceedings+--+Computers+%26+Digital+Techniques%22">IEE Proceedings -- Computers & Digital Techniques</searchLink>; September 2000, Vol. 147 Issue 5, p313-322, 10p
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        Value: 10.1049/ip-cdt:20000537
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      – Code: eng
        Text: English
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        PageCount: 10
        StartPage: 313
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      – TitleFull: Minimisation of power dissipation during test application in full-scan sequential circuits using primary input freezing.
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            NameFull: Nicolici, N.
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              M: 09
              Text: September 2000
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              Y: 2000
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