APA (7th ed.) Citation

Tabib-Azar, M., & Akinwande, D. (2000). Real-time imaging of semiconductor space-charge regions using high-spatial resolution evanescent microwave microscope. Review of Scientific Instruments, 71(3), 1460. https://doi.org/10.1063/1.1150480

Chicago Style (17th ed.) Citation

Tabib-Azar, M., and D. Akinwande. "Real-time Imaging of Semiconductor Space-charge Regions Using High-spatial Resolution Evanescent Microwave Microscope." Review of Scientific Instruments 71, no. 3 (2000): 1460. https://doi.org/10.1063/1.1150480.

MLA (9th ed.) Citation

Tabib-Azar, M., and D. Akinwande. "Real-time Imaging of Semiconductor Space-charge Regions Using High-spatial Resolution Evanescent Microwave Microscope." Review of Scientific Instruments, vol. 71, no. 3, 2000, p. 1460, https://doi.org/10.1063/1.1150480.