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Real-time imaging of semiconductor space-charge regions using high-spatial resolution evanescent microwave microscope.

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Bibliographic Details
Title: Real-time imaging of semiconductor space-charge regions using high-spatial resolution evanescent microwave microscope.
Authors: Tabib-Azar, M., Akinwande, D.
Source: Review of Scientific Instruments; March 2000, Vol. 71 Issue 3, p1460-1465, 6p
Database: Applied Science & Technology Source
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  Data: Real-time imaging of semiconductor space-charge regions using high-spatial resolution evanescent microwave microscope.
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        Value: 10.1063/1.1150480
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        Text: English
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        StartPage: 1460
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      – TitleFull: Real-time imaging of semiconductor space-charge regions using high-spatial resolution evanescent microwave microscope.
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              Text: March 2000
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