Real-time imaging of semiconductor space-charge regions using high-spatial resolution evanescent microwave microscope.
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| Title: | Real-time imaging of semiconductor space-charge regions using high-spatial resolution evanescent microwave microscope. |
|---|---|
| Authors: | Tabib-Azar, M., Akinwande, D. |
| Source: | Review of Scientific Instruments; March 2000, Vol. 71 Issue 3, p1460-1465, 6p |
| Database: | Applied Science & Technology Source |
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