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A minimal universal test set for selt-test of EXOR-Sum-of-Products circuits.

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Title: A minimal universal test set for selt-test of EXOR-Sum-of-Products circuits.
Authors: Kalay, Ugur, Hall, Douglas V., Perkowski, Marek A.
Source: IEEE Transactions on Computers; March 2000, Vol. 49 Issue 3, p267-276, 10p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500655746
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: A minimal universal test set for selt-test of EXOR-Sum-of-Products circuits.
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        Value: 10.1109/12.841130
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        Text: English
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        PageCount: 10
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      – TitleFull: A minimal universal test set for selt-test of EXOR-Sum-of-Products circuits.
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            NameFull: Kalay, Ugur
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            NameFull: Hall, Douglas V.
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              Text: March 2000
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