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Applications of an ultra high resolution evanescent microwave imaging probe in the nondestructive testing of materials.

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Bibliographic Details
Title: Applications of an ultra high resolution evanescent microwave imaging probe in the nondestructive testing of materials.
Authors: Tabib-Azar, M.
Source: Materials Evaluation; January 2001, Vol. 59 Issue 1, p70-78, 9p
Database: Applied Science & Technology Source
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