Strain relaxation in InGaAs lattice engineered substrates.

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Bibliographic Details
Title: Strain relaxation in InGaAs lattice engineered substrates.
Authors: Chavarkar, P., Mathis, S. K., Zhao, L.
Source: Journal of Electronic Materials; July 2000, Vol. 29 Issue 7, p944-949, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500707789
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Strain relaxation in InGaAs lattice engineered substrates.
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  Data: <searchLink fieldCode="AU" term="%22Chavarkar%2C+P%2E%22">Chavarkar, P.</searchLink><br /><searchLink fieldCode="AU" term="%22Mathis%2C+S%2E+K%2E%22">Mathis, S. K.</searchLink><br /><searchLink fieldCode="AU" term="%22Zhao%2C+L%2E%22">Zhao, L.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; July 2000, Vol. 29 Issue 7, p944-949, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500707789
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s11664-000-0186-1
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 944
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      – TitleFull: Strain relaxation in InGaAs lattice engineered substrates.
        Type: main
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            NameFull: Chavarkar, P.
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            NameFull: Mathis, S. K.
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            NameFull: Zhao, L.
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            – D: 01
              M: 07
              Text: July 2000
              Type: published
              Y: 2000
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              Value: 29
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              Value: 7
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